J. Toušek: search on Z-Library

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1

Interpretation of Indirect Nuclear Spin−Spin Couplings in Isomers of Adenine: Novel Approach to Analyze Coupling Electron Deformation Density Using Localized Molecular Orbitals

Marek, Radek, Křístková, Anežka, Maliňáková, Kateřina, Toušek, Jaromír, Marek, Jaromír, Hocek, Michal, Malkina, Olga L., Malkin, Vladimir G.

Journal:

Journal of Physical Chemistry A

Year:

2010

Language:

english

File:

PDF, 336 KB

english, 2010

2

Influence of photon recycling on photovoltage spectra of GaSb diodes

Journal:

Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 321 KB

english, 2004

3

Surface photovoltage measurements in μc-Si:H: Manifestation of the bottom space charge region

Švrček, V., Pelant, I., Fojtı́k, P., Kočka, J., Fejfar, A., Toušek, J., Kondo, M., Matsuda, A.

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 342 KB

english, 2002

4

Effect of silicon nitride layers on the minority carrier diffusion length in c-Si wafers

J. Toušek, J. Toušková, A. Poruba, P. Hlídek, J. Lörinčík

Journal:

Journal of Applied Physics

Year:

2006

Language:

english

File:

PDF, 384 KB

english, 2006

5

Characterization of Fluorene - Thiophene Copolymer Layers by the Surface Photovoltage Method

Toušek, Jiří, Pavlačková, Petra, Cimrová, Věra, Toušková, Jana

Journal:

Macromolecular Symposia

Year:

2008

Language:

english

File:

PDF, 115 KB

english, 2008

6

Diffusion length in CdTe by measurement of photovoltage spectra in CdS/CdTe solar cells

Toušek, J., Kindl, D., Toušková, J., Dolhov, S., Poruba, A.

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 311 KB

english, 2001

7

Discussion of “Occurrence of the Salt Film during Initiation and Growth of Corrosion Pits” [T. R. Beck and R. C. Alkire (pp. 1662–1666, Vol. 126, No. 10)]

Journal:

Journal of The Electrochemical Society

Year:

1980

Language:

english

File:

PDF, 266 KB

english, 1980

8

Transport anisotropy in microcrystalline silicon studied by measurement of ambipolar diffusion length

Švrček, V., Pelant, I., Kočka, J., Fojtı́k, P., Rezek, B., Stuchlı́ková, H., Fejfar, A., Stuchlı́k, J., Poruba, A., Toušek, J.

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 733 KB

english, 2001

9

Photovoltage spectroscopy of InAs/GaAs quantum dot structures

Toušková, J., Samochin, E., Toušek, J., Oswald, J., Hulicius, E., Pangrác, J., Melichar, K., Šimeček, T.

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 296 KB

english, 2002

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